Board Test Methods

The following are some of the test methods used by Agilent Medalist ICT systems. Some of these test methods may not be available on your system, but can be included as an option.

Shorts & Opens: An unpowered test method that tests for unexpected shorts and opens; expected results are confirmed using a known good board. Shorts and opens testing is described in Shorts and Opens Testing in Analog Testing.

Analog In-circuit: An unpowered test that measures the value of analog devices such as resistors and capacitors. Analog in-circuit testing is described in Analog In-Circuit Testing in Analog Testing.

Agilent Vectorless Test EP (VTEP): An unpowered test of the connectivity from each pin on a device to the circuit board. The system uses the VTEP hardware to measure the capacitance from a pin of a device to the VTEP probe to determine connectivity. See TestJet and VTEP v2.0 Powered!

Agilent Polarity Check: An unpowered test that automatically tests the orientation (polarity) of electrolytic capacitors on the board under test. This test detects reversed capacitors before they can fail and possibly damage the board or cause safety hazards. See Polarity Check

Agilent Connect Check: (Mux systems only) An unpowered test method that uses the intrinsic pin protection diodes of the device-under-test to verify contact between the devices. For details, see Connect Check.

Analog Functional: A powered test that applies a stimulus to a device or circuit under test and measures its response. Analog functional testing is described in Analog Functional and Mixed Testing in Analog Testing.

Mixed Testing: A powered test that applies analog functional and digital test methods to a device or circuit. Mixed testing is described in Analog Functional and Mixed Testing in Analog Testing.

Digital In-circuit: A powered test that applies vector patterns to the device and tests for the expected outputs. Digital in-circuit techniques are also used for programming of devices such as Flash and PLDs. Digital in-circuit testing is described in Digital Testing.

Boundary-scan: A powered test of boundary-scan devices. Boundary-Scan in described in Boundary-Scan Testing.

Medalist i3070 LED Test: Measures LED color and luminosity with superior throughput during Medalist i3070 in-circuit test. It returns the LED color value and luminosity in nanometers and µW/cm2 to accuracies of ±3 nm and ± 10% respectively.